Yi-Lin Liu, Ching-Chi Huang, Huang-Chih Chen, Li-Chen Fu. An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy. In 12th Asian Control Conference, ASCC 2019, Kitakyushu-shi, Japan, June 9-12, 2019. pages 138-143, IEEE, 2019. [doi]
@inproceedings{LiuHCF19,
title = {An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy},
author = {Yi-Lin Liu and Ching-Chi Huang and Huang-Chih Chen and Li-Chen Fu},
year = {2019},
url = {http://ieeexplore.ieee.org/document/8765021},
researchr = {https://researchr.org/publication/LiuHCF19},
cites = {0},
citedby = {0},
pages = {138-143},
booktitle = {12th Asian Control Conference, ASCC 2019, Kitakyushu-shi, Japan, June 9-12, 2019},
publisher = {IEEE},
isbn = {978-4-88898-300-6},
}