Frankie Liu, Ron Ho, Robert J. Drost, Scott Fairbanks. On-chip samplers for test and debug of asynchronous circuits. In 13th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2007), 12-14 March 2006, Berkeley, California, USA. pages 153-162, IEEE Computer Society, 2007. [doi]
@inproceedings{LiuHDF07,
title = {On-chip samplers for test and debug of asynchronous circuits},
author = {Frankie Liu and Ron Ho and Robert J. Drost and Scott Fairbanks},
year = {2007},
doi = {10.1109/ASYNC.2007.24},
url = {http://doi.ieeecomputersociety.org/10.1109/ASYNC.2007.24},
tags = {testing, debugging},
researchr = {https://researchr.org/publication/LiuHDF07},
cites = {0},
citedby = {0},
pages = {153-162},
booktitle = {13th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2007), 12-14 March 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2771-0},
}