On-chip samplers for test and debug of asynchronous circuits

Frankie Liu, Ron Ho, Robert J. Drost, Scott Fairbanks. On-chip samplers for test and debug of asynchronous circuits. In 13th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2007), 12-14 March 2006, Berkeley, California, USA. pages 153-162, IEEE Computer Society, 2007. [doi]

Abstract

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