Yan Liu, Scott Hareland, Donald Hall, Bill Wold, Roger Hubing, Robert Mehregan, Ronen Malka, Manish Sharma, Tom Lane. A Simulation-based strategy used in electrical design for reliability. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 208-212, IEEE, 2009. [doi]
Abstract is missing.