The following publications are possibly variants of this publication:
- Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar TransistorXiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht. access, 8:69471-69481, 2020. [doi]
- On-Line Measurement of Chip Temperature Based on Blocking Leakage Current of the Insulated-Gate Bipolar Transistor Module in the High-Temperature Reverse-Bias TestJinyuan Li, Yunong Liu, Yaosheng Li, Zhongyuan Chen, Chunsheng Guo, Hao Li. access, 9:87697-87705, 2021. [doi]