Jamie Liu, Ben Jaiyen, Yoongu Kim, Chris Wilkerson, Onur Mutlu. An experimental study of data retention behavior in modern DRAM devices: implications for retention time profiling mechanisms. In Avi Mendelson, editor, The 40th Annual International Symposium on Computer Architecture, ISCA'13, Tel-Aviv, Israel, June 23-27, 2013. pages 60-71, ACM, 2013. [doi]
Abstract is missing.