Yueyang Liu, Xiangwei Jiang, Liwei Wang 0003, Yunfei En, Runsheng Wang. Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{LiuJWEW19,
title = {Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack},
author = {Yueyang Liu and Xiangwei Jiang and Liwei Wang 0003 and Yunfei En and Runsheng Wang},
year = {2019},
doi = {10.1109/IRPS.2019.8720414},
url = {https://doi.org/10.1109/IRPS.2019.8720414},
researchr = {https://researchr.org/publication/LiuJWEW19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}