Yueyang Liu, Xiangwei Jiang, Liwei Wang 0003, Yunfei En, Runsheng Wang. Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.