A Scan-Based Delay Test Method for Reduction of Overtesting - researchr publication authors

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Hui Liu, Huawei Li, Yu Hu, Xiaowei Li. A Scan-Based Delay Test Method for Reduction of Overtesting. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 521-526, IEEE Computer Society, 2008. [doi]

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