Hui Liu, Huawei Li, Yu Hu, Xiaowei Li. A Scan-Based Delay Test Method for Reduction of Overtesting. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 521-526, IEEE Computer Society, 2008. [doi]
@inproceedings{LiuLHL08,
title = {A Scan-Based Delay Test Method for Reduction of Overtesting},
author = {Hui Liu and Huawei Li and Yu Hu and Xiaowei Li},
year = {2008},
doi = {10.1109/DELTA.2008.25},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.25},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LiuLHL08},
cites = {0},
citedby = {0},
pages = {521-526},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}