Ming-Wei Liu, Yu-Heng Lin, Yuan-Chieh Lo, Chih-Hsuan Shih, Pei-Chun Lin. Defect Detection of Grinded and Polished Workpieces Using Faster R-CNN. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2021, Delft, The Netherlands, July 12-16, 2021. pages 1290-1296, IEEE, 2021. [doi]
@inproceedings{LiuLLSL21,
title = {Defect Detection of Grinded and Polished Workpieces Using Faster R-CNN},
author = {Ming-Wei Liu and Yu-Heng Lin and Yuan-Chieh Lo and Chih-Hsuan Shih and Pei-Chun Lin},
year = {2021},
doi = {10.1109/AIM46487.2021.9517664},
url = {https://doi.org/10.1109/AIM46487.2021.9517664},
researchr = {https://researchr.org/publication/LiuLLSL21},
cites = {0},
citedby = {0},
pages = {1290-1296},
booktitle = {IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2021, Delft, The Netherlands, July 12-16, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4139-1},
}