Ming-Wei Liu, Yu-Heng Lin, Yuan-Chieh Lo, Chih-Hsuan Shih, Pei-Chun Lin. Defect Detection of Grinded and Polished Workpieces Using Faster R-CNN. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2021, Delft, The Netherlands, July 12-16, 2021. pages 1290-1296, IEEE, 2021. [doi]
Abstract is missing.