Changyong Liu, Nianlong Liu, Zhiting Lin, Xiulong Wu, Chunyu Peng, Qiang Zhao, Xuan Li, Junning Chen, Xuan Zeng 0001, Xiangdong Hu. A single event upset tolerant latch with parallel nodes. IEICE Electronic Express, 16(11):20190208, 2019. [doi]
Abstract is missing.