An 1-bit by 1-bit High Parallelism In-RRAM Macro with Co-Training Mechanism for DCNN Applications

Chi Liu, Shao-Tzu Li, Tong-Lin Pan, Cheng-En Ni, Yun Sung, Chia-Lin Hu, Kang-Yu Chang, Tuo-Hung Hou, Tian-Sheuan Chang, Shyh-Jye Jou. An 1-bit by 1-bit High Parallelism In-RRAM Macro with Co-Training Mechanism for DCNN Applications. In 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022, Hsinchu, Taiwan, April 18-21, 2022. pages 1-4, IEEE, 2022. [doi]

Authors

Chi Liu

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Shao-Tzu Li

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Tong-Lin Pan

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Cheng-En Ni

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Yun Sung

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Chia-Lin Hu

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Kang-Yu Chang

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Tuo-Hung Hou

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Tian-Sheuan Chang

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Shyh-Jye Jou

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