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X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak. X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan. IEEE Trans. VLSI Syst., 29(8):1553-1566, 2021. [doi]

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