Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer. Minimal area test points for deterministic patterns. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-7, IEEE, 2016. [doi]
@inproceedings{LiuMMRRT16,
title = {Minimal area test points for deterministic patterns},
author = {Yingdi Liu and Elham K. Moghaddam and Nilanjan Mukherjee and Sudhakar M. Reddy and Janusz Rajski and Jerzy Tyszer},
year = {2016},
doi = {10.1109/TEST.2016.7805825},
url = {http://dx.doi.org/10.1109/TEST.2016.7805825},
researchr = {https://researchr.org/publication/LiuMMRRT16},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}