Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer. Minimal area test points for deterministic patterns. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-7, IEEE, 2016. [doi]
Abstract is missing.