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Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer. Minimal area test points for deterministic patterns. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-7, IEEE, 2016. [doi]

The following publications are possibly variants of this publication:

Embedded Deterministic Test PointsCesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada. tvlsi, 25(10):2949-2961, 2017. [doi]

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