Lushan Liu, Pradeep Nagaraj, Shambhu Upadhyaya, Ramalingam Sridhar. Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing, 24(1-3):165-179, 2008. [doi]
@article{LiuNUS08,
title = {Defect Analysis and Defect Tolerant Design of Multi-port SRAMs},
author = {Lushan Liu and Pradeep Nagaraj and Shambhu Upadhyaya and Ramalingam Sridhar},
year = {2008},
doi = {10.1007/s10836-007-5023-5},
url = {http://dx.doi.org/10.1007/s10836-007-5023-5},
tags = {analysis, design},
researchr = {https://researchr.org/publication/LiuNUS08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
pages = {165-179},
}