Defect Analysis and Defect Tolerant Design of Multi-port SRAMs

Lushan Liu, Pradeep Nagaraj, Shambhu Upadhyaya, Ramalingam Sridhar. Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing, 24(1-3):165-179, 2008. [doi]

Abstract

Abstract is missing.