Wavelet-based figure of merit for macro-uniformity - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Xing Liu, Gary Overall, Travis Riggs, Rebecca Silveston-Keith, Julie G. Whitney, George Chiu 0001, Jan P. Allebach. Wavelet-based figure of merit for macro-uniformity. In Peter D. Burns, Sophie Triantaphillidou, editors, Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013. Volume 8653 of SPIE Proceedings, SPIE, 2013. [doi]

This author has not been identified. Look up 'Xing Liu' in GoogleThis author has not been identified. Look up 'Gary Overall' in GoogleThis author has not been identified. Look up 'Travis Riggs' in GoogleThis author has not been identified. Look up 'Rebecca Silveston-Keith' in GoogleThis author has not been identified. Look up 'Julie G. Whitney' in GoogleThis author has not been identified. Look up 'George Chiu 0001' in GoogleThis author has not been identified. Look up 'Jan P. Allebach' in Google

runs on WebDSL