Wavelet-based figure of merit for macro-uniformity

Xing Liu, Gary Overall, Travis Riggs, Rebecca Silveston-Keith, Julie G. Whitney, George Chiu 0001, Jan P. Allebach. Wavelet-based figure of merit for macro-uniformity. In Peter D. Burns, Sophie Triantaphillidou, editors, Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013. Volume 8653 of SPIE Proceedings, SPIE, 2013. [doi]

Abstract

Abstract is missing.