Xing Liu, Gary Overall, Travis Riggs, Rebecca Silveston-Keith, Julie G. Whitney, George Chiu 0001, Jan P. Allebach. Wavelet-based figure of merit for macro-uniformity. In Peter D. Burns, Sophie Triantaphillidou, editors, Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013. Volume 8653 of SPIE Proceedings, SPIE, 2013. [doi]
@inproceedings{LiuORSW0A13,
title = {Wavelet-based figure of merit for macro-uniformity},
author = {Xing Liu and Gary Overall and Travis Riggs and Rebecca Silveston-Keith and Julie G. Whitney and George Chiu 0001 and Jan P. Allebach},
year = {2013},
doi = {10.1117/12.2008515},
url = {https://doi.org/10.1117/12.2008515},
researchr = {https://researchr.org/publication/LiuORSW0A13},
cites = {0},
citedby = {0},
booktitle = {Image Quality and System Performance X, Burlingame, California, USA, February 3-7, 2013},
editor = {Peter D. Burns and Sophie Triantaphillidou},
volume = {8653},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819494269},
}