Performance bound and yield analysis for analog circuits under process variations - researchr publication authors

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Xuexin Liu, Adolfo Adair Palma-Rodriguez, Santiago Rodriguez-Chavez, Sheldon X.-D. Tan, Esteban Tlelo-Cuautle, Yici Cai. Performance bound and yield analysis for analog circuits under process variations. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013. pages 761-766, IEEE, 2013. [doi]

This author has not been identified. Look up 'Xuexin Liu' in GoogleThis author has not been identified. Look up 'Adolfo Adair Palma-Rodriguez' in GoogleThis author has not been identified. Look up 'Santiago Rodriguez-Chavez' in GoogleThis author has not been identified. Look up 'Sheldon X.-D. Tan' in GoogleThis author has not been identified. Look up 'Esteban Tlelo-Cuautle' in GoogleThis author has not been identified. Look up 'Yici Cai' in Google

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