Xuexin Liu, Adolfo Adair Palma-Rodriguez, Santiago Rodriguez-Chavez, Sheldon X.-D. Tan, Esteban Tlelo-Cuautle, Yici Cai. Performance bound and yield analysis for analog circuits under process variations. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013. pages 761-766, IEEE, 2013. [doi]
Abstract is missing.