Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu. Fine-Grained Adaptive Testing Based on Quality Prediction. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
@inproceedings{LiuPYLCG18, title = {Fine-Grained Adaptive Testing Based on Quality Prediction}, author = {Mengyun Liu and Renjian Pan and Fangming Ye and Xin Li and Krishnendu Chakrabarty and Xinli Gu}, year = {2018}, doi = {10.1109/TEST.2018.8624891}, url = {https://doi.org/10.1109/TEST.2018.8624891}, researchr = {https://researchr.org/publication/LiuPYLCG18}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, publisher = {IEEE}, isbn = {978-1-5386-8382-8}, }