Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu. Fine-Grained Adaptive Testing Based on Quality Prediction. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
Abstract is missing.