Shaobo Liu, Qinru Qiu, Qing Wu. Full-chip leakage current estimation based on statistical sampling techniques. In Vijay Narayanan, Zhiyuan Yan, Enrico Macii, Sanjukta Bhanja, editors, Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008. pages 391-394, ACM, 2008. [doi]
Abstract is missing.