Yong Liu, Pengpeng Ren, Da Wang, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang. New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 6, IEEE, 2022. [doi]
Abstract is missing.