Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli. Nyquist data converter testing and yield analysis using behavioral simulation. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 341-348, IEEE Computer Society, 1993. [doi]
@inproceedings{LiuS93:0,
title = {Nyquist data converter testing and yield analysis using behavioral simulation},
author = {Edward W. Y. Liu and Alberto L. Sangiovanni-Vincentelli},
year = {1993},
doi = {10.1145/259794.259851},
url = {http://doi.acm.org/10.1145/259794.259851},
tags = {testing, analysis, data-flow, data-flow analysis},
researchr = {https://researchr.org/publication/LiuS93%3A0},
cites = {0},
citedby = {0},
pages = {341-348},
booktitle = {Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993},
editor = {Michael R. Lightner and Jochen A. G. Jess},
publisher = {IEEE Computer Society},
isbn = {0-8186-4490-7},
}