Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli. Nyquist data converter testing and yield analysis using behavioral simulation. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 341-348, IEEE Computer Society, 1993. [doi]
Abstract is missing.