Verification of Nyquist data converters using behavioral simulation

Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli. Verification of Nyquist data converters using behavioral simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(4):493-502, 1995. [doi]

Authors

Edward W. Y. Liu

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Alberto L. Sangiovanni-Vincentelli

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