Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli. Verification of Nyquist data converters using behavioral simulation. IEEE Trans. on CAD of Integrated Circuits and Systems, 14(4):493-502, 1995. [doi]
@article{LiuS95:2,
title = {Verification of Nyquist data converters using behavioral simulation},
author = {Edward W. Y. Liu and Alberto L. Sangiovanni-Vincentelli},
year = {1995},
doi = {10.1109/43.372375},
url = {http://doi.ieeecomputersociety.org/10.1109/43.372375},
tags = {data-flow},
researchr = {https://researchr.org/publication/LiuS95%3A2},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {14},
number = {4},
pages = {493-502},
}