An independent-gate FinFET SRAM cell for high data stability and enhanced integration density

Zhiyu Liu, Sherif A. Tawfik, Volkan Kursun. An independent-gate FinFET SRAM cell for high data stability and enhanced integration density. In 2007 IEEE International SOC Conference, Tampere, Finland, November 19-21, 2007. pages 63-66, IEEE, 2007. [doi]

Abstract

Abstract is missing.