A novel ACO-based pattern generation for peak power estimation in VLSI circuits

Yi-Ling Liu, Chun-Yao Wang, Yung-Chih Chen, Ya-Hsin Chang. A novel ACO-based pattern generation for peak power estimation in VLSI circuits. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 317-323, IEEE, 2009. [doi]

Abstract

Abstract is missing.