A Novel Fault-Tolerant Last-Level Cache to Improve Reliability at Near-Threshold Voltage

Wei Liu, Zhigang Wei, Wei Du. A Novel Fault-Tolerant Last-Level Cache to Improve Reliability at Near-Threshold Voltage. In Deming Chen, Houman Homayoun, Baris Taskin, editors, Proceedings of the 2018 on Great Lakes Symposium on VLSI, GLSVLSI 2018, Chicago, IL, USA, May 23-25, 2018. pages 231-236, ACM, 2018. [doi]

Abstract

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