Chun-Chen Liu, Yen-Hsiang Wang, Yilei Li, Chien-Heng Wong, Tien Pei Chou, Young-Kai Chen, M.-C. Frank Chang. Invited - A 2.2 GHz SRAM with high temperature variation immunity for deep learning application under 28nm. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 2, ACM, 2016. [doi]
Abstract is missing.