A signal degradation reduction method for memristor ratioed logic (MRL) gates

Bosheng Liu, Ying Wang, Zhiqiang You, Yinhe Han, Xiaowei Li. A signal degradation reduction method for memristor ratioed logic (MRL) gates. IEICE Electronic Express, 12(8):20150062, 2015. [doi]

Authors

Bosheng Liu

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Ying Wang

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Zhiqiang You

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Yinhe Han

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Xiaowei Li

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