On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation - researchr publication

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Xiao Liu, Qiang Xu. On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 303-308, IEEE Computer Society, 2008. [doi]

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