Internal profile reconstruction for MEMS microstructures based on infrared transmission technology

Yi Liu, Chenyang Xue, Xiujian Chou, Kangkang Niu, Jun Liu. Internal profile reconstruction for MEMS microstructures based on infrared transmission technology. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 1029-1032, IEEE, 2010. [doi]

Authors

Yi Liu

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Chenyang Xue

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Xiujian Chou

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Kangkang Niu

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Jun Liu

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