Prognosis of chip-loss failure in high-power IGBT module by self-testing

Yeke Liu, Dawei Xiang, Yifan Fu. Prognosis of chip-loss failure in high-power IGBT module by self-testing. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 6836-6840, IEEE, 2016. [doi]

Abstract

Abstract is missing.