Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen. A test strategy for time-to-digital converters using dynamic element matching and dithering. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 3809-3812, IEEE, 2005. [doi]
Abstract is missing.