Adaptive Random Testing by Exclusion through Test Profile - researchr publication authors

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Huai Liu, Xiaodong Xie, Jing Yang, Yansheng Lu, Tsong Yueh Chen. Adaptive Random Testing by Exclusion through Test Profile. In Ji Wang, W. K. Chan, Fei-Ching Kuo, editors, Proceedings of the 10th International Conference on Quality Software, QSIC 2010, Zhangjiajie, China, 14-15 July 2010. pages 92-101, IEEE Computer Society, 2010. [doi]

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