Adaptive Random Testing by Exclusion through Test Profile

Huai Liu, Xiaodong Xie, Jing Yang, Yansheng Lu, Tsong Yueh Chen. Adaptive Random Testing by Exclusion through Test Profile. In Ji Wang, W. K. Chan, Fei-Ching Kuo, editors, Proceedings of the 10th International Conference on Quality Software, QSIC 2010, Zhangjiajie, China, 14-15 July 2010. pages 92-101, IEEE Computer Society, 2010. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.