Adaptive Random Testing by Exclusion through Test Profile

Huai Liu, Xiaodong Xie, Jing Yang, Yansheng Lu, Tsong Yueh Chen. Adaptive Random Testing by Exclusion through Test Profile. In Ji Wang, W. K. Chan, Fei-Ching Kuo, editors, Proceedings of the 10th International Conference on Quality Software, QSIC 2010, Zhangjiajie, China, 14-15 July 2010. pages 92-101, IEEE Computer Society, 2010. [doi]

@inproceedings{LiuXYLC10,
  title = {Adaptive Random Testing by Exclusion through Test Profile},
  author = {Huai Liu and Xiaodong Xie and Jing Yang and Yansheng Lu and Tsong Yueh Chen},
  year = {2010},
  doi = {10.1109/QSIC.2010.61},
  url = {http://dx.doi.org/10.1109/QSIC.2010.61},
  tags = {testing, random testing},
  researchr = {https://researchr.org/publication/LiuXYLC10},
  cites = {0},
  citedby = {0},
  pages = {92-101},
  booktitle = {Proceedings of the 10th International Conference on Quality Software, QSIC 2010, Zhangjiajie, China, 14-15 July 2010},
  editor = {Ji Wang and W. K. Chan and Fei-Ching Kuo},
  publisher = {IEEE Computer Society},
}