Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method

Chang Liu 0019, Long Zhang 0004, Xu He, Yang Guo. Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method. IEEE Access, 6:48740-48746, 2018. [doi]

Authors

Chang Liu 0019

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Long Zhang 0004

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Xu He

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Yang Guo

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