Chang Liu 0019, Long Zhang 0004, Xu He, Yang Guo. Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method. IEEE Access, 6:48740-48746, 2018. [doi]
@article{LiuZHG18,
title = {Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method},
author = {Chang Liu 0019 and Long Zhang 0004 and Xu He and Yang Guo},
year = {2018},
doi = {10.1109/ACCESS.2018.2867639},
url = {https://doi.org/10.1109/ACCESS.2018.2867639},
researchr = {https://researchr.org/publication/LiuZHG18},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {6},
pages = {48740-48746},
}