Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory - researchr publication related

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R. Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, G. Haller, Vincent Pouget, Dean Lewis. Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectronics Reliability, 51(9-11):1658-1661, 2011. [doi]

The following publications are possibly variants of this publication:

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICsM. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, O. Crépel, Dean Lewis. mr, 48(8-9):1529-1532, 2008. [doi]

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