Advanced Packaging Warpage Modeling with DeepONet-Based Operator Learning

Shao-Yu Lo, Che-Ming Chang, Yao-Wen Chang. Advanced Packaging Warpage Modeling with DeepONet-Based Operator Learning. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2025, Munich, Germany, October 26-30, 2025. pages 1-9, IEEE, 2025. [doi]

Abstract

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