Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault

Wan-Yu Lo, Ching-Yi Chen, Chin-Lung Su, Cheng-Wen Wu. Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 417-422, IEEE Computer Society, 2008. [doi]

Abstract

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